| 摘要 |
PROBLEM TO BE SOLVED: To obtain a device measuring apparatus in which a device can be conveyed precisely to a next process by separating a contact pusher from the device after the electric characteristic of the device is measured, and by which a next device can be measured with good efficiency. SOLUTION: This device measuring apparatus 100 is provided with an IC socket 20 which measures the electric characteristic of a device 1 under test. The device measuring apparatus is provided with a carrier 30 which holds the device 1 under test and which transfers the device 1 under test to the IC socket 20. The device measuring apparatus is provided with a contact pusher 40 by which the device 1 under test transferred to the IC socket 20 is pressed to the IC socket 20, and by which the device 1 under test is connected electrically to the IC socket 20. The device measuring apparatus is provided with a separation shaft 9 by which the contact pusher 40 is separated from the device 1 under test, in a state that the device 1 under test is held in the carrier 30 when the contact pusher 40 is separated from the IC socket 20 after the device 1 under test is connected electrically to the IC socket 20 by the contact pusher 40.
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