| 摘要 |
A control circuit, system for, and method of, testing a device under test (DUT) coupled to a load having a controllable load current level. The DUT is capable of operating in a regulated range and an unregulated range. In one embodiment, the control circuit includes: (1) minimum and maximum current control stages that set minimum and maximum load current values, respectively, for the control circuit and (2) an integrator, coupled to the DUT. In a constant current mode, the integrator selects one of the minimum and maximum load current values to control the load current level and test the DUT while the DUT is operating in the regulated range. In a constant voltage mode, the integrator produces an intermediate load current value based on a relationship between a voltage of an output of the DUT and a reference voltage to control the load current level and test the DUT while the DUT is operating in the unregulated range.
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