发明名称 PLASMA DEPOSITION EQUIPMENT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A plasma deposition equipment of a semiconductor device is provided to optimize a coverage of a deposition layer and to reduce an error rate, by installing a plurality of wafer stages in the plasma deposition equipment using an ion metal plasma(IMP) sputtering method. CONSTITUTION: Direct current(DC) power is supplied to a target supply unit(21) located in an upper portion of a chamber. Radio frequency(RF) power is supplied to an RF coil unit(22) located in a lower portion of the target supply unit. The RF coil unit transforms target ions supplied from the target supply unit into plasma. Alternate current(AC) power is supplied to a plurality of wafer stages(WS1-WS8) located in a lower portion of the RF coil unit. The wafer stages evaporate plasma ions generated from the RF coil unit on a wafer.
申请公布号 KR20010018069(A) 申请公布日期 2001.03.05
申请号 KR19990033874 申请日期 1999.08.17
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SU JIN;LEE, JEONG RAE
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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