发明名称 |
PLASMA DEPOSITION EQUIPMENT OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A plasma deposition equipment of a semiconductor device is provided to optimize a coverage of a deposition layer and to reduce an error rate, by installing a plurality of wafer stages in the plasma deposition equipment using an ion metal plasma(IMP) sputtering method. CONSTITUTION: Direct current(DC) power is supplied to a target supply unit(21) located in an upper portion of a chamber. Radio frequency(RF) power is supplied to an RF coil unit(22) located in a lower portion of the target supply unit. The RF coil unit transforms target ions supplied from the target supply unit into plasma. Alternate current(AC) power is supplied to a plurality of wafer stages(WS1-WS8) located in a lower portion of the RF coil unit. The wafer stages evaporate plasma ions generated from the RF coil unit on a wafer.
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申请公布号 |
KR20010018069(A) |
申请公布日期 |
2001.03.05 |
申请号 |
KR19990033874 |
申请日期 |
1999.08.17 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SU JIN;LEE, JEONG RAE |
分类号 |
H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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地址 |
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