发明名称 Werkwijze voor het vervaardigen van een halfgeleiderinrichting.
摘要 A method for making a semiconductor device having a pattern of highly doped regions located some distance apart in a semiconductor substrate and regions of low doping located between the highly doped regions. A diffusion barrier material is applied to the semiconductor substrate at the location of the regions of low doping by imprinting with the barrier material in the pattern of the regions of low doping. The doping material is applied after or before imprinting with barrier material so that the highly doped regions are formed essentially between the barrier material in the substrate.
申请公布号 NL1012961(C2) 申请公布日期 2001.03.05
申请号 NL19991012961 申请日期 1999.09.02
申请人 STICHTING ENERGIEONDERZOEK CENTRUM NEDERLAND 发明人 JAN HENDRIK BULTMAN
分类号 H01L21/225;H01L31/04;H01L31/068;H01L31/18 主分类号 H01L21/225
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