发明名称 |
APPARATUS FOR PLANARIZING SEMICONDUCTOR SUBSTRATE |
摘要 |
PURPOSE: An apparatus for planarizing a semiconductor substrate is provided to control a foreign substance and to guarantee uniformity of a polishing rate, by minimizing the foreign substance or a scratch which could be generated on a film surface after a polishing process, and by controlling a phenomenon that slurry particle is left on a pad groove as a remnant. CONSTITUTION: A pad supporting unit(2) supports a pad(1)of a chemical mechanical polishing(CMP) apparatus. A head supporting unit(4) supports a head(3). An electrical bias is applied between the pad supporting unit and the head supporting unit by a load applying unit(5) when a wafer is polished.
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申请公布号 |
KR20010018412(A) |
申请公布日期 |
2001.03.05 |
申请号 |
KR19990034371 |
申请日期 |
1999.08.19 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, CHUNG WAN |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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