发明名称 APPARATUS FOR PLANARIZING SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE: An apparatus for planarizing a semiconductor substrate is provided to control a foreign substance and to guarantee uniformity of a polishing rate, by minimizing the foreign substance or a scratch which could be generated on a film surface after a polishing process, and by controlling a phenomenon that slurry particle is left on a pad groove as a remnant. CONSTITUTION: A pad supporting unit(2) supports a pad(1)of a chemical mechanical polishing(CMP) apparatus. A head supporting unit(4) supports a head(3). An electrical bias is applied between the pad supporting unit and the head supporting unit by a load applying unit(5) when a wafer is polished.
申请公布号 KR20010018412(A) 申请公布日期 2001.03.05
申请号 KR19990034371 申请日期 1999.08.19
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, CHUNG WAN
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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