发明名称 METHOD FOR TREATING SUBSTRATES FOR MICROELECTRONICS AND SUBSTRATES OBTAINED BY SAID METHOD
摘要 The invention relates to a method for treating substrates (1) for microelectronics or opto-electronics, comprising a useful layer (6) which is at least partially composed of an oxidable material on at least one of the surfaces thereof. The inventive method consists of a first sacrificial oxidation phase whereby a certain thickness of the material making up the useful layer (6) can be removed from the surface of each substrate (1); a phase (200) in which the surface which underwent the first stage of sacrificial oxidation is polished; and a third sacrificial oxidation phase whereby material making up the useful layer (6) is removed once more from the polished surface (17).
申请公布号 WO0115218(A1) 申请公布日期 2001.03.01
申请号 WO2000FR02331 申请日期 2000.08.17
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES;BARGE, THIERRY;GHYSELEN, BRUNO;IWAMATSU, TOSHIAKI;NARUOKA, HIDEKI;FURIHATA, JUNICHIRO;MITANI, KIYOSHI 发明人 BARGE, THIERRY;GHYSELEN, BRUNO;IWAMATSU, TOSHIAKI;NARUOKA, HIDEKI;FURIHATA, JUNICHIRO;MITANI, KIYOSHI
分类号 H01L21/306;H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/306
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