发明名称 Printing sublithographic images using a shadow mandrel and off-axis exposure
摘要 The present invention overcomes the limitations of the prior art to allow for the creation of smaller components for use in logic circuits. The invention provides a new method of defining and forming features on a semiconductor substrate by using a layer of material, referred to as a shadow mandrel layer, to cast a shadow. A trough is etched in the shadow mandrel layer. At least one side of the trough will be used to cast a shadow in the bottom of the trough. A conformally deposited photoresist is used to capture the image of the shadow. The image of the shadow is used to define and form a feature. This allows for the creation of images on the surface of a wafer without the diffraction effects encountered in conventional photolithography. This allows for a reduced device size and increased chip operating speed.
申请公布号 US6194268(B1) 申请公布日期 2001.02.27
申请号 US19980183926 申请日期 1998.10.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FURUKAWA TOSHIHARU;HAKEY MARK C.;HOLMES STEVEN J.;HORAK DAVID V.;RABIDOUX PAUL A.
分类号 G03F7/00;G03F7/20;H01L21/027;H01L21/033;H01L21/28;H01L21/311;H01L21/768;(IPC1-7):H01L21/336 主分类号 G03F7/00
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