发明名称 CAPACITOR FOR SEMICONDUCTOR MEMORY ELEMENT AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To provide a capacitor for a semiconductor element that can secure large capacity by preparing a dielectric film having a high dielectric constant that reduces the occurrence of a leakage current. SOLUTION: A bottom electrode 40 is formed on a semiconductor substrate 30. The surface of a bottom electrode is treated so that the generation of a natural oxide film will be impeded. An amorphous TaON film 43 is evaporated on the bottom electrode as a dielectric film. Subsequently, the amorphous TaON film 43 is heat-treated within the range where an amorphous state will be maintained. Then a bottom electrode 44 is formed on a TaON film.
申请公布号 JP2001057414(A) 申请公布日期 2001.02.27
申请号 JP20000199295 申请日期 2000.06.30
申请人 HYUNDAI ELECTRONICS IND CO LTD 发明人 LEE KI-JUNG;RI TAIKAKU
分类号 H01G4/33;H01G4/40;H01L21/02;H01L21/314;H01L21/316;H01L21/318;H01L21/8242;H01L27/108 主分类号 H01G4/33
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