发明名称 |
CAPACITOR FOR SEMICONDUCTOR MEMORY ELEMENT AND ITS MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a capacitor for a semiconductor element that can secure large capacity by preparing a dielectric film having a high dielectric constant that reduces the occurrence of a leakage current. SOLUTION: A bottom electrode 40 is formed on a semiconductor substrate 30. The surface of a bottom electrode is treated so that the generation of a natural oxide film will be impeded. An amorphous TaON film 43 is evaporated on the bottom electrode as a dielectric film. Subsequently, the amorphous TaON film 43 is heat-treated within the range where an amorphous state will be maintained. Then a bottom electrode 44 is formed on a TaON film. |
申请公布号 |
JP2001057414(A) |
申请公布日期 |
2001.02.27 |
申请号 |
JP20000199295 |
申请日期 |
2000.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND CO LTD |
发明人 |
LEE KI-JUNG;RI TAIKAKU |
分类号 |
H01G4/33;H01G4/40;H01L21/02;H01L21/314;H01L21/316;H01L21/318;H01L21/8242;H01L27/108 |
主分类号 |
H01G4/33 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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