发明名称 |
Method of manufacturing the floating gate of split-gate flash memory |
摘要 |
A method for fabricating the floating gate of a split-gate flash memory. A patterned sacrificial layer is formed over a substrate. A doped polysilicon layer and an insulation layer are formed in sequence over the sacrificial layer. The doped polysilicon layer and the insulation layer above the sacrificial layer are removed by chemical-mechanical polishing. The exposed doped polysilicon layer is removed. Finally, the sacrificial layer is removed to complete the fabrication of the floating gate.
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申请公布号 |
US6194300(B1) |
申请公布日期 |
2001.02.27 |
申请号 |
US20000609212 |
申请日期 |
2000.07.05 |
申请人 |
TAIWAN SEMICONDUCTOR MFG. CO. LTD. |
发明人 |
HUNG CHIH-WEI;SHIH CHI-JEN |
分类号 |
H01L21/28;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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