发明名称 METHODS AND APPARATUS FOR CALIBRATING TEMPERATURE MEASUREMENTS AND MEASURING CURRENTS
摘要 PURPOSE: A method and an apparatus for calibrating temperature measurements and measuring currents are provided to calibrate an optical probe in order to realize accurate temperature reading when a system is exposed to thermal radiation from a heated substrate, in the case where a temperature measuring system is initially introduced in an rapid thermal processing(RTP) apparatus. CONSTITUTION: A calibration current source(70) preferably includes a biasing circuit(72), an output transistor current source(74), and an offset circuit(76). In the temperature calibrating method, a calibration table is generated by applying a plurality of input signals to a calibration current source(70) to produce a plurality of output signals. Then, the calibration table is stored. When an output signal of a photodetector is received, the calibration input signal corresponding to the received photodetector output signal is determined based upon the stored calibration table.
申请公布号 KR20010015266(A) 申请公布日期 2001.02.26
申请号 KR20000039308 申请日期 2000.07.10
申请人 APPLIED MATERIALS INC. 发明人 BLAU DAVID;JADUSHLEVER ELIA
分类号 G01J1/18;G01J5/00;G01J5/02;G01J5/10;G01J5/52;H01L21/26;H01L21/66;(IPC1-7):H01L21/324 主分类号 G01J1/18
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