发明名称 SYSTEM AND CASSETTE FOR TESTING SEMICONDUCTOR CHIP
摘要 <p>PURPOSE: Provided is a technique for effectively testing and transporting IC chips with a carrier tape. CONSTITUTION: A cassette(20) for transporting and testing semiconductor IC chips(14) comprises a tape supply reel(20.1) and a tape take up reel(20.2), an apertured carrier tape(12) wound on the reels, the tape having sprocket holes and chip sites at which the chips are pre-loaded topside up, the tape allowing access to bath the topside and backside of the chips, a test station window(20.3) located in a surface of the cassette so as Provided is access to the topside of a chip in registration with the window, a first cavity(20.5) for receiving an indexing mechanism for moving the tape and for bringing chips sites into registration with the test station window and a second cavity(20.6) for receiving an ejector mechanism for pushing on the backside of a semiconductor chip.</p>
申请公布号 KR20010015434(A) 申请公布日期 2001.02.26
申请号 KR20000042975 申请日期 2000.07.26
申请人 LUCENT TECHNOLOGIES INC. 发明人 AKERSON JEFFREY JOHN;SEITZER PHILIP WILLIAM;VASUDEVAN KEELATHUR N
分类号 G01R31/26;H01L21/00;H01L21/60;H01L21/66;H01L21/673;H05K13/04;H05K13/08;(IPC1-7):H01L21/66 主分类号 G01R31/26
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