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发明名称
TEST HEAD STRUCTURE FOR INTEGRATED CIRCUIT TESTER
摘要
申请公布号
KR20010012912(A)
申请公布日期
2001.02.26
申请号
KR19997010880
申请日期
1999.11.23
申请人
null, null
发明人
한네스존시.;밀러찰스에이.;스탠포드딘
分类号
G01R31/26;G01R1/06;G01R31/28;G01R31/319;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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