| 摘要 |
PURPOSE: A circuit for integrally testing switch capacity of a high voltage switchgear is provide to test circuit which can be manufactured more simply, can be driven more simply and has a usefulness improved. CONSTITUTION: The circuit(1) for synthetic testing of a switch capacity of a high voltage switchgear with the use of a large current circuit(2) having a large current source and the high voltage switchgear to be tested, a high voltage circuit(3) connected in parallel to the high voltage switchgear to be tested, and a means for switching the large current source to the high voltage switchgear to be tested. In this case, at least two auxiliary switches(13,14) are connected in series to the means for switching the large current source. The first auxiliary switch(13) is set to the side opposite to the large current source of the second auxiliary switch(14), and a diode circuit(15) is arranged in parallel to the second auxiliary switch(14) for blocking a current running towards the large current source.
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