发明名称 |
RELIABLE DIFFUSION RESISTOR AND DIFFUSION CAPACITOR |
摘要 |
PURPOSE: A diffusion resistor and a diffusion capacitor are provided to make the parasitic capacitance of a diffusion junction very low and to improve reliability. CONSTITUTION: A diffusion resistor(52) is provided that utilizes the block mask to cover only the intrinsic polysilicon gate region. An n-type source/drain doping(60) is implanted in contact regions, but no in an intrinsic polysilicon gate region. An N-type(or P-type) diffusion resistor in P-well(64)(or N-well) is provided that utilizes a block mask to cover only the intrinsic polysilicon gate region. The N-type(or P-type) source/drain doping is implanted in the contact regions but not in the intrinsic polysilicon gate region. A P-well(or N-well) block mask is used to keep the P-well(or N-well) from forming under the buried resistor. Also, provided are a buried capacitor and a method of making both a buried resistor and a buried capacitor.
|
申请公布号 |
KR20010015521(A) |
申请公布日期 |
2001.02.26 |
申请号 |
KR20000071203 |
申请日期 |
2000.11.28 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
TONG MINH H;NOWAK EDWARD J;TIAN XIAOWEI |
分类号 |
H01L27/04;H01L21/329;H01L21/334;H01L21/822;H01L21/8234;H01L27/06;H01L27/108;H01L29/94;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|