发明名称 SEMICONDUCTOR DEVICE HAVING BARRIER METAL LAYER AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device having a barrier metal layer and a method for manufacturing the same are provided to form a semiconductor device having an improved barrier characteristic by preventing crystallization of a barrier metal layer. CONSTITUTION: An insulating layer(102) is formed on a semiconductor substrate(101). A through hole(104) is formed in an inside of the insulating layer(102). The first refractory metal nitride layer(106) is formed on a surface of the through hole(104). A surface of the first refractory metal nitride layer(106) is oxidized or oxygen is absorbed on the surface of the first refractory metal nitride layer(106). The second refractory metal nitride layer(108) for absorbing oxygen is formed on the first refractory metal nitride layer(106).
申请公布号 KR20010014778(A) 申请公布日期 2001.02.26
申请号 KR20000020803 申请日期 2000.04.19
申请人 NEC CORPORATION 发明人 TAGUWA TETSUYA
分类号 H01L23/52;H01L21/28;H01L21/3205;H01L21/768;(IPC1-7):H01L21/28 主分类号 H01L23/52
代理机构 代理人
主权项
地址