发明名称 METHOD FOR FORMING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE
摘要 A plasma processing system configured for use in processing a substrate after metal etching. The substrate includes a layer of photoresist disposed thereon. The plasma processing system includes a plasma generating region and a baffle plate disposed between the plasma generating region and the substrate. The baffle plate includes a central blocked portion disposed in a center region of the baffle plate. The baffle plate further includes an annular porous portion surrounding the central blocked portion. The annular porous portion includes a plurality of through holes configured for permitting a H 2O plasma generated in the plasma generating region to pass through the holes to reach a surface of the substrate. The plasma processing system also includes a chuck disposed below the baffle plate to support the substrate during the processing.
申请公布号 KR20010014051(A) 申请公布日期 2001.02.26
申请号 KR19997012082 申请日期 1998.06.24
申请人 发明人
分类号 H01L21/302;H01J37/32;H01L21/02;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/28 主分类号 H01L21/302
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