发明名称 |
METHOD FOR FORMING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE |
摘要 |
A plasma processing system configured for use in processing a substrate after metal etching. The substrate includes a layer of photoresist disposed thereon. The plasma processing system includes a plasma generating region and a baffle plate disposed between the plasma generating region and the substrate. The baffle plate includes a central blocked portion disposed in a center region of the baffle plate. The baffle plate further includes an annular porous portion surrounding the central blocked portion. The annular porous portion includes a plurality of through holes configured for permitting a H 2O plasma generated in the plasma generating region to pass through the holes to reach a surface of the substrate. The plasma processing system also includes a chuck disposed below the baffle plate to support the substrate during the processing.
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申请公布号 |
KR20010014051(A) |
申请公布日期 |
2001.02.26 |
申请号 |
KR19997012082 |
申请日期 |
1998.06.24 |
申请人 |
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发明人 |
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分类号 |
H01L21/302;H01J37/32;H01L21/02;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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