| 摘要 |
PURPOSE: A testing cost of a memory cell is reduced by comparing reference data from a pattern generator with stored data from a memory cell array, and storing and outputting a first state when the stored data match the reference data, and storing and outputting a second state otherwise. CONSTITUTION: In a semiconductor memory device (100), reference data is supplied to a memory array and a comparator (110) from a pattern generator (112) through a read/write data line RWD to test a memory. The comparator (110) compares reference data with array data, and accumulates all compares results in an internal latch. Thereby, as a channel used for comparing normal array data with the reference data can be used, a tester can test more semiconductor memory devices in parallel, and throughput for an acceptance test is improved.
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