发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE: To provide a semiconductor device, the operation speed of which can be increased by reducing the channel length without increasing the gate resistance, and a method for manufacturing the device. CONSTITUTION: An MOSFET is provided with a groove type element isolation structure 2 formed in the main surface of a semiconductor substrate 1, a pair of extensions 3 and source and drain regions 4 both of which are selectively formed in the main surface of the substrate 1 and faced opposite to each other on both sides of a channel region 50, and silicon oxide films 5 formed on the source and drain regions 4 via the element isolation structure 2 and silicon oxide film 12. The MOSFET is also provided with sidewalls 6 formed on the side faces of the silicon oxide films 5, a gate insulating film 7 formed on the main surface of the substrate 1 in the portion where the cannel area 50 is formed, and a gate electrode 8 which is formed so as to fill up the inversely tapered recessed section formed of the side faces of the sidewalls 6 and upper surface of the gate insulating film 7.
申请公布号 KR20010014940(A) 申请公布日期 2001.02.26
申请号 KR20000026939 申请日期 2000.05.19
申请人 发明人
分类号 H01L29/78;H01L21/28;H01L21/336;H01L29/423;H01L29/43;H01L29/49;(IPC1-7):H01L29/78 主分类号 H01L29/78
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