| 摘要 |
PROBLEM TO BE SOLVED: To provide a socket for testing an electronic apparatus or a semiconductor package, capable of stably and continuously keeping good electrical contact between its contact terminal and an external connection terminal. SOLUTION: An end part of a contact terminal of a socket for testing an electronic apparatus or a semiconductor package is divided into two or more, with which an external contact terminal makes contact, the plurality of end parts 3L, 3R are joined to separated elastic parts 2L, 2R respectively, the elastic parts are joined to a common support part 6 directly or by means of the other elastic part, and the plurality of end parts are thereby caused to hit on each other if either of the end parts is going to move horizontally. This inhibits their horizontal movement, thus inhibiting relative sliding motion between the end parts and the external contact terminal.
|
