发明名称 DURABILITY TEST APPARATUS
摘要 PROBLEM TO BE SOLVED: To execute an accurate durability test by always supplying a specified conduction current to an electronic controller. SOLUTION: The durability test apparatus has a current sensor 1 which monitors currents being supplied to loads R1-Rn connected to an electronic controller Ob, thereby detecting failures of the loads R1-Rn during test. In switching over the plurality of loads R1-Rn one after another, using a multi- terminal switch 2, a specified conduction current is always supplied to the electronic controller Ob, without supplying those loads with currents, except loads R1-Rn where on abnormality is found.
申请公布号 JP2001051001(A) 申请公布日期 2001.02.23
申请号 JP19990220961 申请日期 1999.08.04
申请人 SUMITOMO WIRING SYST LTD 发明人 YAMAMURA TAKEHIKO
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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