发明名称 PIXEL CAPACITY INSPECTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To inspect pixel capacities in a TFT-LCD in a short time. SOLUTION: A voltage Vp is applied from a power source (e) to a node A by turning switches SW1, SW3 on. A voltage Vs is applied from the power source to a node B by turning the switch SW1 off. After the switch SW3 is turned off and the switch SW1 is turned on, a potential difference between both ends of the switch SW3 is measured by a voltmeter V. When a potential difference to be obtained at both ends of the switch SW3 when the switch SW2 is always kept off and a potenial difference to be obtained at both ends of the switch SW3 when the switch SW2 is always kept on are defined respectively asΔVs1,ΔVs2, a pixel capacity Cp can be calculated by (ΔCs.ΔVs1.ΔVs2)/ (Vp-Vs)(ΔVs1-ΔVs2)), providedΔCs is a reference capacity.</p>
申请公布号 JP2001051620(A) 申请公布日期 2001.02.23
申请号 JP19990222482 申请日期 1999.08.05
申请人 ASIA ELECTRONICS INC 发明人 MORI KAZUO
分类号 G09F9/00;G01R27/26;G01R31/00;G02F1/136;G02F1/1368;(IPC1-7):G09F9/00 主分类号 G09F9/00
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