| 摘要 |
PROBLEM TO BE SOLVED: To realize an IC tester capable of easily detecting timing errors. SOLUTION: A rate signal is outputted based on a cycle information stored in a rate memory, the rate signal is delayed to output edges based on timing information of an edge memory, and the IC tester for testing a device under test is improved, using the edges. The IC tester is characterized by providing an arithmetic unit 34 for obtaining timing errors, using inputted cycle information and the timing information.
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