发明名称 APPARATUS AND METHOD FOR MEASUREMENT OF CURRENT
摘要 <p>PROBLEM TO BE SOLVED: To obtain a technique which can miniaturize an apparatus as a whole and measure a current more precisely and to obtain a technique which can measure the DC component of a current. SOLUTION: This current measuring apparatus 200 comprises a detecting unit 12 and a measuring unit 18. An electrical interconnection 22 is passed through the hollow part 14 of the detecting unit 12. A current flows in the electrical interconnection 22 to a load 16 from a power-supply device 10. A magnetoresistance element is embedded in the detecting unit 12. When a current flows, a magnetic field is generated, and the electric resistance value of the magnetoresistance element is changed.</p>
申请公布号 JP2001050987(A) 申请公布日期 2001.02.23
申请号 JP19990226506 申请日期 1999.08.10
申请人 ADVANTEST CORP 发明人 TAKAYANAGI FUMIKAZU
分类号 G01R15/20;G01R19/00;(IPC1-7):G01R15/20 主分类号 G01R15/20
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