发明名称 CLEANING OF SEMICONDUCTOR MANUFACTURE EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To remove a by-product attaching to a main vacuum pump to reduce the particles attaching to a substrate without decreasing the operation efficiency in a method for cleaning a semiconductor manufacturing equipment. SOLUTION: When cleaning a CVD system 1, first rotation of a turbo molecular pump 25 is stopped with a gate bulb 24 closed. Next, the gate bulb 24 is opened and a processing chamber 2 is evacuated with a dry pump 28 through the turbo molecular pump 25. Then, Ar gas is supplied into a reactor cavity 18 from a gas source 11c, and microwaves are applied to the Ar gas by a microwave generator 19 to generate a plasma. Successively, an NF3 gas is supplied into the reactor cavity 18 from a gas source 11d to be converted into radicals. By sending fluorine radicals F* to the processing chamber 2, the system is cleaned.
申请公布号 JP2001053008(A) 申请公布日期 2001.02.23
申请号 JP19990221607 申请日期 1999.08.04
申请人 APPLIED MATERIALS INC 发明人 OTA SHIGERU
分类号 H01L21/302;C23C14/00;C23C16/44;H01L21/205;H01L21/3065;(IPC1-7):H01L21/205;H01L21/306 主分类号 H01L21/302
代理机构 代理人
主权项
地址