发明名称 SURFACE STATE JUDGING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an accurate surface state judging device by using one optical system for reducing the size of a judging device and the cost, and at the same time, omitting the correction processing. SOLUTION: The surface state judging device includes a light emission part 201 that emits pulse laser, a scan part 301 that performs the scanning of the pulse laser from the light emission part 201, a light reception part 215 that receives reflected light, a distance measurement part 303 that measures the distance to an irradiation point, a reflection level measurement part 305 that measures a reflection level, a control part 307 that controls the light emission and scan parts 201 and 301, a data table 311 that records the distance to a target point and a surface state to the reflection level, and a judgment processing part 309 that refers to the data table 311 for judging the surface state based on data from the distance measurement and reflection level measurement parts 303 and 305.
申请公布号 JP2001051060(A) 申请公布日期 2001.02.23
申请号 JP19990229360 申请日期 1999.08.13
申请人 SUMITOMO ELECTRIC IND LTD 发明人 MORII MIYOSHI;YASUO HIROYUKI
分类号 G01B11/00;G01N21/47;G01S17/88;G01S17/95;G01W1/00;G08G1/00;(IPC1-7):G01S17/88 主分类号 G01B11/00
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