发明名称 LAMINATED SUBSTRATE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To allow as sharp and smooth carrier concentration profile with no drop in a transition region from an N+ silicon water to an N- silicon wafer. SOLUTION: An N- silicon wafer is laminated on the surface of an N+ silicon wafer. An even and high-resistance N- layer con be manufactured easily on the active layer side of a laminated substrate at a low cost. Boron concentration on a lamination interface is get of 1×1013-5×1015 atoms/cm3, with Sb or As employed as a dopant for a high concentration. The carrier concentration profile in a transition region is sharp to dissolve drop. As a result, an N-/N+ type laminated substrate is manufactured with a high yield. So, a high-resistance wafer is provided as an alternate for an epitaxial wafer.
申请公布号 JP2001052976(A) 申请公布日期 2001.02.23
申请号 JP19990229782 申请日期 1999.08.16
申请人 MITSUBISHI MATERIALS SILICON CORP 发明人 TOMIZAWA KENJI;FUNADA TAKESHI;KOMATSU KEI;HAYAKAWA JUNICHI
分类号 H01L21/02;(IPC1-7):H01L21/02 主分类号 H01L21/02
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