发明名称 |
LAMINATED SUBSTRATE AND MANUFACTURE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To allow as sharp and smooth carrier concentration profile with no drop in a transition region from an N+ silicon water to an N- silicon wafer. SOLUTION: An N- silicon wafer is laminated on the surface of an N+ silicon wafer. An even and high-resistance N- layer con be manufactured easily on the active layer side of a laminated substrate at a low cost. Boron concentration on a lamination interface is get of 1×1013-5×1015 atoms/cm3, with Sb or As employed as a dopant for a high concentration. The carrier concentration profile in a transition region is sharp to dissolve drop. As a result, an N-/N+ type laminated substrate is manufactured with a high yield. So, a high-resistance wafer is provided as an alternate for an epitaxial wafer.
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申请公布号 |
JP2001052976(A) |
申请公布日期 |
2001.02.23 |
申请号 |
JP19990229782 |
申请日期 |
1999.08.16 |
申请人 |
MITSUBISHI MATERIALS SILICON CORP |
发明人 |
TOMIZAWA KENJI;FUNADA TAKESHI;KOMATSU KEI;HAYAKAWA JUNICHI |
分类号 |
H01L21/02;(IPC1-7):H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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