发明名称 MILLIMETER WAVE IMAGING SYSTEM
摘要 PROBLEM TO BE SOLVED: To obtain an image with a high contrast that can be recognized to the details by emitting a pulse beam with a prescribed period and a sinusoidal wave electromagnetic wave with a millimeter wave band frequency where a different frequency has been added to a first frequency, and detecting the phase difference between an electrical signal, where the pulse beam through an object is subjected to photoelectric conversion and a reference sinusoidal wave. SOLUTION: A millimeter wave 16 emitted from an antenna 12 is transmitted through a sample object 13 and is received by an electrochemical crystal 10. A pulse beam emitted from a laser 4 is transmitted through a PBS(polarization beam splitter) 6 for taking out a first polarization component, is transmitted through a HWP(half-wave plate) 7 and a QWP(quarter-wave plate) 8, and is reflected by a mirror 9 and enters the electrochemical crystal 10. A pulse beam that is reflected by an optical reflection film 11, while a second polarization component is generated enters a PD-L (photodiode) 5 from a PBS 6. The strength of an electrical signal extracted by a lock-in amplifier 15 is processed by a computer 14 and is used as the data of the millimeter wave intensity distribution image of the sample object 13.
申请公布号 JP2001050908(A) 申请公布日期 2001.02.23
申请号 JP19990229132 申请日期 1999.08.13
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 SASAKI AIICHIRO;NAGATSUMA TADAO;SHINAGAWA MITSURU
分类号 G01N22/00;G01N21/21;G01N22/02;(IPC1-7):G01N22/00 主分类号 G01N22/00
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