发明名称 Method of fabricating shallow trench isolation structure
摘要 A method of fabricating shallow trench isolation. A silicon oxide layer is formed on a substrate. The silicon oxide layer is patterned and a portion of the substrate is removed to form a trench within the substrate. A liner oxide layer is formed on the sidewall of the trench. An insulating layer is formed on the substrate and filled in the trench. A portion of the insulating layer is removed by CMP to expose the silicon oxide layer. The silicon oxide layer is removed and the STI structure is completed.
申请公布号 US6190995(B1) 申请公布日期 2001.02.20
申请号 US19980208282 申请日期 1998.12.08
申请人 UNITED MICROELECTRONICS CORP. 发明人 WU KUN-LIN;HSU CHENG-JUNG
分类号 H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/762
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