发明名称 |
Process for the forming of isolation layers of a predetermined thickness in semiconductor wafers for the manufacturing of integrated circuits |
摘要 |
A process for forming insulating layers of predetermined thickness in semiconductor wafer for manufacturing integrated circuits by means of PHI /N<+(+)>/N<(-)>-type structures comprises the steps of: forming one or more regions of N<+(+)> semiconducting material inside a N<(-)> semiconducting material substrate; growing an epitaxial layer on the semiconducting material; defining an island structure by removing part of the epitaxial layer; selectively anodizing these regions for forming porous silicon and performing oxidation of the formed porous silicon regions. |
申请公布号 |
AU6723900(A) |
申请公布日期 |
2001.02.19 |
申请号 |
AU20000067239 |
申请日期 |
2000.08.02 |
申请人 |
SHINE S.P.A. |
发明人 |
MARCO BALUCANI;VITALY BONDARENKO;ALDO FERRARI;GIULIO LAMEDICA;ANATOLY KUZMICH PANFILENKO;VALENTINA YAKOVTSEVA |
分类号 |
H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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