发明名称 Process for the forming of isolation layers of a predetermined thickness in semiconductor wafers for the manufacturing of integrated circuits
摘要 A process for forming insulating layers of predetermined thickness in semiconductor wafer for manufacturing integrated circuits by means of PHI /N<+(+)>/N<(-)>-type structures comprises the steps of: forming one or more regions of N<+(+)> semiconducting material inside a N<(-)> semiconducting material substrate; growing an epitaxial layer on the semiconducting material; defining an island structure by removing part of the epitaxial layer; selectively anodizing these regions for forming porous silicon and performing oxidation of the formed porous silicon regions.
申请公布号 AU6723900(A) 申请公布日期 2001.02.19
申请号 AU20000067239 申请日期 2000.08.02
申请人 SHINE S.P.A. 发明人 MARCO BALUCANI;VITALY BONDARENKO;ALDO FERRARI;GIULIO LAMEDICA;ANATOLY KUZMICH PANFILENKO;VALENTINA YAKOVTSEVA
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
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