发明名称 |
APPARATUS FOR CONTROLLING SOLUTION PRESSURE OF WAFER RINSER |
摘要 |
PURPOSE: An apparatus for controlling a solution pressure of a wafer rinser is provided to enhance efficiency of a fabricating process and remove efficiently alien substances from a wafer by varying a pressure of solution injected to the wafer. CONSTITUTION: A vacuum chuck(12) for loading a wafer(W) is installed in an inside of a chamber(11). The vacuum chuck(12) is connected with a drive motor(13) and a shaft(13A). The vacuum chuck(12) is rotated by a driving force of the drive motor(13). A nozzle(14) is installed on an upper side of the vacuum chuck(12) in order to inject a solution to a surface of the wafer(W). The nozzle(14) is connected with a tank(16) by using a pipe. A pump(15) is installed between the nozzle(14) and the tank(16). The solution is supplied from the tank(16) to the nozzle(14) by an operation of the tank(16). A valve is installed between the pump(15) and the tank(16).
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申请公布号 |
KR100289397(B1) |
申请公布日期 |
2001.02.19 |
申请号 |
KR19980013256 |
申请日期 |
1998.04.14 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
JUNG, U HYEOK |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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