发明名称 APPARATUS FOR CONTROLLING SOLUTION PRESSURE OF WAFER RINSER
摘要 PURPOSE: An apparatus for controlling a solution pressure of a wafer rinser is provided to enhance efficiency of a fabricating process and remove efficiently alien substances from a wafer by varying a pressure of solution injected to the wafer. CONSTITUTION: A vacuum chuck(12) for loading a wafer(W) is installed in an inside of a chamber(11). The vacuum chuck(12) is connected with a drive motor(13) and a shaft(13A). The vacuum chuck(12) is rotated by a driving force of the drive motor(13). A nozzle(14) is installed on an upper side of the vacuum chuck(12) in order to inject a solution to a surface of the wafer(W). The nozzle(14) is connected with a tank(16) by using a pipe. A pump(15) is installed between the nozzle(14) and the tank(16). The solution is supplied from the tank(16) to the nozzle(14) by an operation of the tank(16). A valve is installed between the pump(15) and the tank(16).
申请公布号 KR100289397(B1) 申请公布日期 2001.02.19
申请号 KR19980013256 申请日期 1998.04.14
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 JUNG, U HYEOK
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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