发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device by crystallizing a silicon film using a laser or an equivalent intensive light and through manufacturing by obtaining the silicon film having a proper crystallization. SOLUTION: A cover film formed by such a material having a proper heat conductivity as aluminum nitride is selectively provided on a substrate 101, and further a silicon film 105 is formed. When a laser or an equivalent intensive light is radiated under this condition, a portion near the aluminum nitride films 102 and 103 of the silicon film 105 coagulates immediately by absorbing heat by the aluminum nitride, however speed to coagulate for other parts is slow. As a result, crystallization proceed from aluminum nitride part. Thus the silicon film 105, having superior crystallinity is selectively obtained, and a semiconductor device is manufactured using this film.
申请公布号 JP2001044446(A) 申请公布日期 2001.02.16
申请号 JP20000209115 申请日期 2000.07.10
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 OTANI HISASHI;MIYANAGA SHOJI;YAMAZAKI SHUNPEI;TAKEMURA YASUHIKO
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/20
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