| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a device and/or a method for outputting measurement data, that easily analyzes the manufacture state of a formation base material in a device for manufacturing a multilayer capacitor forming base material for laminating metal and dielectric films for forming. SOLUTION: In the measurement data-output device, measurement data of measurement parts 3a and 3b is accumulated at a storage part with the angle of a rotary drum 2 being acquired by an angle detection part, and the amount of deviation to the reference angle of the measurement parts 3a and 3b stored in advance is corrected for displaying, thus facilitating analysis of the measurement result of the formation state of a capacitor formation base material, where a film-formed position is known even when the measurement parts 3a and 3b are arranged, while the measurement parts face the rotating drum 2 at a different angle, and reducing the time required for analyzing. Also, since data display can be made without depending on the rotational speed, analysis of the influence on the rotational speed according the difference of a measurement data waveform is facilitated.</p> |
