发明名称 MATERIAL TESTER FOR TESTING FILM MATERIAL SUCH AS COATING FILM OR THE LIKE
摘要 PROBLEM TO BE SOLVED: To obtain a material tester capable of detecting the development of a crack in a film material low in rigidity such as a coating film or the like to automatically stop a load mechanism. SOLUTION: A circuit pattern 103 comprising a conductive membrane having a pattern connected thereto from one end thereof to the other end thereof is formed on the surface of the region where the generation of a crack is estimated of a film material 102 to be tested and a crack development detecting means 37 for detecting the development of a crack in the film material 102 by detecting the presence of continuity between both ends of the circuit pattern 103 is provided to both ends of the circuit pattern 103 and a load mechanism 14 is automatically stopped when the development of a crack is detected to perform the fatigue test of the film material such as a coating film or the like without having effect on the physical properties of the film material.
申请公布号 JP2001041869(A) 申请公布日期 2001.02.16
申请号 JP19990219054 申请日期 1999.08.02
申请人 SHIMADZU CORP 发明人 HORIKAWA JUN;IBARAKI MASATOMO
分类号 G01N3/32;(IPC1-7):G01N3/32 主分类号 G01N3/32
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