发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a DRAM of a multi-level that the space is not so occupied, the manufacturing cost is reduced, and yield is improved. SOLUTION: A memory cell of quaternary is arranged at an intersection of a word line WL and a sub-bit line BLNx. Potentials corresponding to 11/10/01/00 are written in a dummy cell arranged at an intersection of a dummy word line DWLN/T and a sub-bit line connected to SSA 31, 32. A SSA 30 outputs data of a memory cell and a reference level of 0x/1x on a sub-bit line to main bit lines GBLN0, GBLT0. The SSA 31 outputs a reference level of 11/10 to a main bit line GBLN4 by balancing potentials of dummy cells connected to both dummy word lines. Similarly, the SSA 32 outputs a reference level of 01/00 to a main bit line GBLT4 by balancing potentials of both dummy cells. A MSA33 discriminates upper bits UPBIT/lower bits LWBIT of data based on potentials on four main bit lines.
申请公布号 JP2001043684(A) 申请公布日期 2001.02.16
申请号 JP19990218189 申请日期 1999.07.30
申请人 NEC CORP 发明人 SUGIBAYASHI NAOHIKO
分类号 G11C11/401;G11C11/407;G11C11/4091;G11C11/56;G11C29/04;(IPC1-7):G11C11/56;G11C29/00 主分类号 G11C11/401
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