TEST PATTERN-GENERATING APPARATUS, METHOD FOR CUTTING LOOP, METHOD FOR CUTTING PROPAGATION PATH, METHOD FOR DETECTING DELAY FAILURE AND COMPUTER-READABLE RECORDING MEDIUM WITH PROGRAM RECORDED FOR MAKING COMPUTER EXECUTE THE METHOD,申请号JP19990215753-传众专利搜索

发明名称	TEST PATTERN-GENERATING APPARATUS, METHOD FOR CUTTING LOOP, METHOD FOR CUTTING PROPAGATION PATH, METHOD FOR DETECTING DELAY FAILURE AND COMPUTER-READABLE RECORDING MEDIUM WITH PROGRAM RECORDED FOR MAKING COMPUTER EXECUTE THE METHOD
摘要
申请公布号	JP2001042012(A)	申请公布日期	2001.02.16
申请号	JP19990215753	申请日期	1999.07.29
申请人	MITSUBISHI ELECTRIC CORP	发明人	FUKUI YOSHIAKI
分类号	G01R31/28;G01R31/3183;G06F11/22;G06F17/50;H01L21/82	主分类号	G01R31/28
代理机构		代理人
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