发明名称 PROBE FOR ELECTRIC INSPECTION
摘要 PROBLEM TO BE SOLVED: To improve contact reliability between a probe for electric inspection and a pad for inspection on a printed wiring board. SOLUTION: This probe for electric inspection comprises a probe pin 2 provided with a spiral recessed part (a) at its side surface and its tip part (c) to be brought into contact with and pressed against a pad for inspection, a housing 3 provided with a spiral protruded part (b) at its inner surface part so as to correspond to and be spirally engaged with the spiral recessed part (a) provided for the probe pin 2 to house the probe pin 2, and a spring 4 with its one end fixed to the rear end part of the probe pin 2 and its other end fixed to the bottom part of the housing 3. By moving the housing 3 spirally engaged with the probe pin 2 by the spiral recessed part (a) and protruded part (b) to the side of the tip part (c) of the probe pin 2 with the tip part (c) of the probe pin 2 in contact with the pad for inspection, the probe pin 2 pushed by the spring 4 is characteristically pressed as being rotated by the spirally engaging action of the spiral recessed part (a) and protruded part (b).
申请公布号 JP2001041976(A) 申请公布日期 2001.02.16
申请号 JP19990219501 申请日期 1999.08.03
申请人 NEC CORP 发明人 SAKAI HIROSHI
分类号 H05K3/00;G01R1/067;G01R31/02;H01L21/66;(IPC1-7):G01R1/067 主分类号 H05K3/00
代理机构 代理人
主权项
地址