发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method of a semiconductor device is to successively etch a photoresist layer and a low permittivity dielectric layer, thus to simplify the manufacturing process and to reduce manufacturing cost. CONSTITUTION: A manufacturing method comprises the steps of: forming an interlayer insulation layer(43) on a semiconductor substrate(41) having a certain base structure; forming a metal interconnect(45) on an upper portion of the interlayer insulation layer; forming a low permittivity dielectric layer(47) and a photoresist layer(49) for silylation on the metal interconnect; exposing the surface of the photoresist layer using a via contact as an exposing mask; developing the photoresist layer in two steps to change the unexposed portion to a silicon oxide layer; and etching the photoresist layer and dielectric layer to form a contact hole for exposing the metal interconnect.
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申请公布号 |
KR20010011269(A) |
申请公布日期 |
2001.02.15 |
申请号 |
KR19990030573 |
申请日期 |
1999.07.27 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAEK, GI HO;KIM, HYEONG GI;KIM, HYEONG SU;KIM, MYEONG SU |
分类号 |
H01L21/32;(IPC1-7):H01L21/32 |
主分类号 |
H01L21/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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