发明名称 A METHOD AND AN ARRANGEMENT FOR INSPECTION OF AND MEASURING AT AN OBJECT
摘要 <p>A method and an arrangement for inspection of a test object (1) for stains or pits at its surface and measuring of any stain or pit, where the test object is arranged in an inspection fixture (3) in at least one defined position. A monitoring device (7) and a scanning device (5) are arranged at the inspection fixture and a control unit (9) for controlling the inspection is included in the arrangement. The surface of the test object is monitored by means of the monitoring device (7) and an image, produced by the monitoring device is shown at the control unit. A stain or pit shown by the monitoring device is subsequently scanned by means of the scanning device and the depth or width of the stain or pit is calculated, dependent of the results of the scanning device.</p>
申请公布号 WO2001011632(A1) 申请公布日期 2001.02.15
申请号 SE2000001488 申请日期 2000.07.14
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