发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A manufacturing method of a semiconductor device is to reduce the dependence of a plane resistance on the line width of a circuit of silicide, thus to prevent from increasing of the plane resistance even reducing of the line width. CONSTITUTION: A manufacturing method of a semiconductor device comprises the steps of: forming a gate electrode(23) by depositing a gate insulation layer(22) on a semiconductor substrate(21); forming a sidewall spacer(25) on both sides of the gate electrode; forming a source/drain region on the substrate of both sides of the gate electrode; selectively removing the exposed gate electrode and the substrate to form an uneven surface; depositing a metal layer on the substrate and annealing the same to form a silicide layer on an interface of the gate electrode and the substrate; and removing the metal layer which did not react with the substrate and the gate electrode.
申请公布号 KR20010011320(A) 申请公布日期 2001.02.15
申请号 KR19990030628 申请日期 1999.07.27
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 HO, WON JUN
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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