发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method of a semiconductor device is to reduce the dependence of a plane resistance on the line width of a circuit of silicide, thus to prevent from increasing of the plane resistance even reducing of the line width. CONSTITUTION: A manufacturing method of a semiconductor device comprises the steps of: forming a gate electrode(23) by depositing a gate insulation layer(22) on a semiconductor substrate(21); forming a sidewall spacer(25) on both sides of the gate electrode; forming a source/drain region on the substrate of both sides of the gate electrode; selectively removing the exposed gate electrode and the substrate to form an uneven surface; depositing a metal layer on the substrate and annealing the same to form a silicide layer on an interface of the gate electrode and the substrate; and removing the metal layer which did not react with the substrate and the gate electrode.
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申请公布号 |
KR20010011320(A) |
申请公布日期 |
2001.02.15 |
申请号 |
KR19990030628 |
申请日期 |
1999.07.27 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
HO, WON JUN |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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