发明名称 METAL INTERCONNECT LAYOUT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A metal interconnect layout is to form an extended contact overlapped portion on a side end of a contact overlapped portion. CONSTITUTION: A contact overlapped portion(20) is formed on a longitudinal end of a metal interconnection(10) to electrically connect to a lower metal interconnection. The contact overlapped portion is provided with at least one contact(30,40). The contact overlapped portion has to secure a minimum distance according to a minimum overlap rule extended from a contact overlapped portion boundary. To the end, a side end of the contact overlapped portion extended from the longitudinal end of the metal interconnection includes an extended contact overlapped portion(50) having a predetermined margin width on a side end portion of the extended contact overlapped portion. The extended contact overlapped portion is formed to compensate a portion to be cut at the contact layout portion. A distance between an outer boundary surface and the extended contact layered portion and a boundary surface of the second interconnection(100) by forming the extended contact layered portion.
申请公布号 KR20010010430(A) 申请公布日期 2001.02.15
申请号 KR19990029318 申请日期 1999.07.20
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 CHUN, BONG JAE
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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