发明名称 |
METAL INTERCONNECT LAYOUT OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A metal interconnect layout is to form an extended contact overlapped portion on a side end of a contact overlapped portion. CONSTITUTION: A contact overlapped portion(20) is formed on a longitudinal end of a metal interconnection(10) to electrically connect to a lower metal interconnection. The contact overlapped portion is provided with at least one contact(30,40). The contact overlapped portion has to secure a minimum distance according to a minimum overlap rule extended from a contact overlapped portion boundary. To the end, a side end of the contact overlapped portion extended from the longitudinal end of the metal interconnection includes an extended contact overlapped portion(50) having a predetermined margin width on a side end portion of the extended contact overlapped portion. The extended contact overlapped portion is formed to compensate a portion to be cut at the contact layout portion. A distance between an outer boundary surface and the extended contact layered portion and a boundary surface of the second interconnection(100) by forming the extended contact layered portion.
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申请公布号 |
KR20010010430(A) |
申请公布日期 |
2001.02.15 |
申请号 |
KR19990029318 |
申请日期 |
1999.07.20 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
CHUN, BONG JAE |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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