发明名称 |
SOLDER TESTING METHOD AND APPARATUS |
摘要 |
PURPOSE: A solder testing method and an apparatus are provided to test a component body and a solder of a mounting component having a lead which is fixed on a PCB. CONSTITUTION: A ring illuminating device has upper and lower illuminating lamps which have different incidence angles toward a solder with respect to a plate surface of a PCB. A camera controls the upper illuminating lamp to illuminate the solder and photographs an area having the solder in a direction perpendicular to the plate surface of a PCB to obtain an upper illuminating image. A camera controls the upper illuminating lamp to illuminate the solder and photographs an area having the solder in a direction perpendicular to the plate surface of a PCB to obtain a lower illuminating image. A vision processor sets a location of a lead testing window on a screen corresponding to a testing area of the solder based on an outline of a component body in the upper illuminating image and estimates a good part of the solder based on the lower illuminating image.
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申请公布号 |
KR20010011037(A) |
申请公布日期 |
2001.02.15 |
申请号 |
KR19990030232 |
申请日期 |
1999.07.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, JI HUN;KIM, JAE SEON |
分类号 |
H05K3/34;(IPC1-7):H05K3/34 |
主分类号 |
H05K3/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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