发明名称 METHODE FOR FORMING CONTACT
摘要 PURPOSE: A method for forming a contact is provided to remove an impurity layer brought about in a contact etching process. CONSTITUTION: A source/drain(26) is formed on a semiconductor substrate(21) having a gate electrode(23). An insulating layer(27) is formed on the entire surface of the gate electrode(23). A photoresist(28) is applied to the insulating layer(27) and selectively patterned so that the region of a self aliened contact is defined. After that, the insulating layer(27) is etched to form a contact hole(29). Reactive by-products(30) from etching the insulation layer is removed thorugh double steps. A polysilicon is deposited on the insulating layer(27) and patterned to form storage node(31).
申请公布号 KR20010011322(A) 申请公布日期 2001.02.15
申请号 KR19990030630 申请日期 1999.07.27
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KANG, SEONG HUN
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/311;H01L21/60;H01L21/768;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L27/10 主分类号 H01L21/28
代理机构 代理人
主权项
地址