发明名称 |
METHODE FOR FORMING CONTACT |
摘要 |
PURPOSE: A method for forming a contact is provided to remove an impurity layer brought about in a contact etching process. CONSTITUTION: A source/drain(26) is formed on a semiconductor substrate(21) having a gate electrode(23). An insulating layer(27) is formed on the entire surface of the gate electrode(23). A photoresist(28) is applied to the insulating layer(27) and selectively patterned so that the region of a self aliened contact is defined. After that, the insulating layer(27) is etched to form a contact hole(29). Reactive by-products(30) from etching the insulation layer is removed thorugh double steps. A polysilicon is deposited on the insulating layer(27) and patterned to form storage node(31).
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申请公布号 |
KR20010011322(A) |
申请公布日期 |
2001.02.15 |
申请号 |
KR19990030630 |
申请日期 |
1999.07.27 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KANG, SEONG HUN |
分类号 |
H01L21/28;H01L21/302;H01L21/3065;H01L21/311;H01L21/60;H01L21/768;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L27/10 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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