发明名称 SILICON WAFER FOR LAMINATING EPITAXIAL LAYER AND EPITAXIAL WAFER
摘要 PROBLEM TO BE SOLVED: To form an epitaxial layer being a thin film on the surface of which trace of COP and LD are almost not generated when it is formed and whose electrical characteristics are improved and the production yield is high. SOLUTION: A silicon wafer is used for laminating an epitaxial layer of a thin film. In the silicon wafer, the number of particles and the number of interstitial dislocations due to crystallization are controlled to be 0 to 10 per wafer, respectively. The silicon wafer has an electrical resistance of <=0.02Ωcm, and an epitaxial thin layer being a thin film having an electrical resistance of >=0.1Ωcm is formed on the wafer by a reduced pressure CVD method. The thickness of the epitaxial thin layer is preferably 0.5 to 5μm.
申请公布号 JP2001039797(A) 申请公布日期 2001.02.13
申请号 JP19990213749 申请日期 1999.07.28
申请人 MITSUBISHI MATERIALS SILICON CORP;MITSUBISHI MATERIALS CORP 发明人 KOYA HIROSHI;KIMURA MASAKI
分类号 H01L21/20;C30B29/06;H01L21/208;(IPC1-7):C30B29/06 主分类号 H01L21/20
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