发明名称 |
Display apparatus having test elements under or bounded by the sealant |
摘要 |
In a LCD with a built-in driver, the quality of all elements is judged. A test TFT is formed immediately below a sealing material which bonds a TFT substrate and an opposite substrate, wherein test terminals are pulled out onto the eaves section of the TFT substrate protruding from the opposite substrate. The quality of TFTs are judged by considering changes of TFT characteristics under the conditions before and after the bonding process.
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申请公布号 |
US6188453(B1) |
申请公布日期 |
2001.02.13 |
申请号 |
US19980162983 |
申请日期 |
1998.09.29 |
申请人 |
SANYO ELECTRIC CO., LTD. |
发明人 |
MATSUOKA HIDEKI;SUZUKI TAKAO;OKU NORIO |
分类号 |
G02F1/1362;G02F1/1368;(IPC1-7):G02F1/133;G02F1/13 |
主分类号 |
G02F1/1362 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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