发明名称 Display apparatus having test elements under or bounded by the sealant
摘要 In a LCD with a built-in driver, the quality of all elements is judged. A test TFT is formed immediately below a sealing material which bonds a TFT substrate and an opposite substrate, wherein test terminals are pulled out onto the eaves section of the TFT substrate protruding from the opposite substrate. The quality of TFTs are judged by considering changes of TFT characteristics under the conditions before and after the bonding process.
申请公布号 US6188453(B1) 申请公布日期 2001.02.13
申请号 US19980162983 申请日期 1998.09.29
申请人 SANYO ELECTRIC CO., LTD. 发明人 MATSUOKA HIDEKI;SUZUKI TAKAO;OKU NORIO
分类号 G02F1/1362;G02F1/1368;(IPC1-7):G02F1/133;G02F1/13 主分类号 G02F1/1362
代理机构 代理人
主权项
地址