发明名称 IMAGE PROCESSING AND INSPECTING METHOD AND IMAGE PROCESSING AND INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an image processing and inspecting method and an image processing and inspecting device capable of extracting the whole shape of a defect quickly and precisely even if a defective image includes many gray-white- flecked noises caused by the surface characteristic of a rubber material and is intermittent, e.g. a defective image existing on the surface of the rubber material. SOLUTION: This image processing and inspecting device is provided with a tracking process section 31, which starts from a local point of an optional picture element in an assembly of picture elements judged as defective among the binalized image data on the surface of an inspection object, searches the direction of the maximum number of defective picture elements in the prescribed radius, determines new local points in sequence, and determines a locus connecting the local points, and an inter-image connection survey section 32, which surveys the connection of the picture elements located on the locus among the binalized image data, determines a connection component that is an assembly of connected picture elements, and specifies the defect shape existing on the surface of the inspection object.
申请公布号 JP2001033225(A) 申请公布日期 2001.02.09
申请号 JP19990211175 申请日期 1999.07.26
申请人 NOK CORP 发明人 ITOU KAZUTOMO
分类号 G01B11/30;(IPC1-7):G01B11/30 主分类号 G01B11/30
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