发明名称 CRYSTALLINE SEMICONDUCTOR THIN FILM AND MANUFACTURE THEREOF AND SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a technique for forming a single-crystal semiconductor thin film or a substantially single-crystal semiconductor thin film. SOLUTION: An amorphous semiconductor thin film is subjected to heat treatment, so as to obtain a crystalline semiconductor thin film 102. After the crystalline semiconductor thin film 102 is irradiated with ultraviolet light or infrared light, heat treatment is performed at 900-1,200 deg.C in a reducing atmosphere. By this process, the surface of the crystalline semiconductor thin film 104 is markedly planarized and defects in grain boundaries or crystal grains are eliminated, and thus a single-crystal semiconductor thin film or a substantially single-crystal semiconductor thin film is obtained.
申请公布号 JP2001035788(A) 申请公布日期 2001.02.09
申请号 JP19990199656 申请日期 1999.07.13
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;OTANI HISASHI;TAKANO YOSHIE
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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