| 摘要 |
PROBLEM TO BE SOLVED: To provide a digital integrated circuit with a built-in inspection circuit where scan path inspection is applicable even when using a latching circuit as a storage circuit and a text pattern having a high fault detection percentage. SOLUTION: This digital integrated circuit can be regarded as a circuit where scan path inspection is applicable in each case, by performing control in two ways of the case where even latching circuits 12L, etc., perform the latch operation by a first clock signal MCK within a period of 0 and a case where odd latch circuits 11L, etc., perform latching operation by a second clock signal SCK, changing the level of a first test signal NT in the order 1, 0, and 1, with the first clock signal MCK as the gate input of the even numbered latching circuits 12L, etc., and the second clock SCK of reverse phase to the first clock signal MCK as the gate input of the odd numbered latching circuits 11L, etc., in test mode, thus a test pattern having a high fault detection percentage can be obtained easily.
|
