| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for screening a laminated ceramic electronic component, in a short time and economical manner. SOLUTION: When a laminated ceramic electronic component is screened, a high voltage is applied for a time interval which is not longer than 100 ms, so that the electric field strength between adjacent internal electrodes connected to different potentials is in the range of 30-100 kV/mm to subject the laminated ceramic electronic component having an internal defect to dielectric breakdown, and separate the acceptable components from defective components.
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