发明名称 TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To easily and stably conduct a precise test and to-reduce the amount of hardware required for the test by connecting a reception high frequency for test and a transmission high frequency for test to each other, thereby forming a pseudo interference state. SOLUTION: A pseudo interference wave transmitter 2 is not installed outside in a radio machine 31. A pseudo interference wave IW1 is power-radiated from the transmission antenna 45 of the radio machine 31 to a space. At the time of a regular operation, the transmission channel and the reception channel of the radio machine 31 are operated by an FDD system. Thus, a reception frequency spectrum is not overlapped with a transmission frequency spectrum. At the time of a test operation, a high speed PN pattern whose speed is higher than that at the time of the regular operation is given. Thus, the band of the transmission frequency spectrum is enlarged and it is overlapped with the reception frequency spectrum. The pseudo interference wave IW1 which is radio- radiated from the transmission antenna 45 to the space is received by a reception system 23, an interference operation for test is executed on a pseudo desired wave DW1 and interference in an actual operation state is reproduced.
申请公布号 JP2001036483(A) 申请公布日期 2001.02.09
申请号 JP19990205179 申请日期 1999.07.19
申请人 OKI ELECTRIC IND CO LTD 发明人 YATABE SUMIO
分类号 H04M1/24;H04B17/00 主分类号 H04M1/24
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