METHOD AND DEVICE FOR NEAR-FIELD MEASURING OF NON-CONTROLLED RADIATION

摘要

The invention concerns systems for measuring the electric field emitted by any electronic equipment. The invention aims at providing a method for near-field measuring enabling to measure in normal operating conditions, and accurately, all the radiating characteristics of an equipment being tested, including the power radiated, the radiated field pattern at every distance, and the form of the emitted signals associated with the radiated field pattern of each of said signals. The method for determining the radiation emitted by an equipment consists in: producing at least one radiation measurement in the radiating field of the equipment; in performing several sets of simultaneous near-field measurements, within a measuring surface located at a short distance from the equipment; and using a method for processing said sets of performed measurements which consists in estimating the statistical properties of the radiated field at any point outside the measuring surface.